Instrumentation

The department is equipped with state-of-the-art spectrometric, microscopic, testing and application equipment utilized in Coatings and Polymeric Materials Science. Most of the instrumentation is included in our Recharge Center, and they are available for use on a fee basis. Please contact Heidi Docktor if you would like a price list.

  • Scanning Vibrating Electrode Technique (SVET)
  • Digital Instruments Nanaoscope IIIa Atomic Force Microscope (AFM) and scanning tunneling microscope
  • Digital Instruments DI-3100 AFM: tapping, contact, nanoindentation, and conductive AFM techniques
  • Numerous Gamry PC-3s and PC-4 used for electrochemical measurements
  • Q-Fog Chamber (2): One running ASTM G85 A5 and one running ASTM B117
  • Q-UV Accelerated Weathering Chamber (2): running ASTM G155 (UVA and UVB lamps available)
  • Q-Sun 1000 xenon arc weathering chamber (2): typically running modified ASTM D6695, 340 nm lamps
  • Atlas MTS Ci4000 Xenon Arc Weather-Ometer: accellerated weathering chamber
  • MacBeth Color-Eye 7000: color spectrometer
  • TA Instruments DMA Q800, (dynamic mechanical analyzer): film/tension clamp, dual cantilever clamp, three-point bend clamp, and gas cooling accessory
  • TA Instruments DSC Q1000, (dynamic scanning calorimeter): refrigerator and liquid nitrogen cooling systems, MDSC and photo-DSC capabilities
  • TA Instruments TGA Q500, (thermogravimetric analyzer): platinum sample pans
  • TA Instruments TMA 2940, (thermomechanical analyzer): expansion, macro expansion, and penetration probes
  • Waters GPC: photodiode array detector, refractive index detector; number average molecular weight, weight average molecular weight, and PDI
  • Instron 5542 Tensile tester: 100 N load cell, environmental chamber, and Bluehill v.2 software
  • TA 2990 Micro Thermal Analyzer: scanning thermal microscope (AFM)
  • FTÅ 125 Contact Angle/Surface Tension Analyzer: used for quick and accurate measurement of contact angles and surface tension with CMC analysis
  • Surface Tensiometer: differential bubble pressure unit
  • Varian Cary 5000 UV-Vis-NIR spectrometer: variable angle specular reflectance and diffuse reflectance accessories
  • PSS Nicomp Particle Sizing Systems 780 and 380: 380/DLS submicron Particle sizer has a size range of 3 nm to 5 microns and the 780 SPOS single Particle optical sizer has a range of 0.5 to 2500 microns.
  • Nicolet FT-IR: Photoacoustic, Real-time, and diffuse reflectance techniques

Last Updated: Monday, October 30, 2007 11:00 AM